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ICLR 2025PosterAccept (Poster)

Test-Time Ensemble via Linear Mode Connectivity: A Path to Better Adaptation

Byungjai Kim, Chanho Ahn, Wissam Baddar, Kikyung Kim, HUIJIN LEE, Saehyun Ahn, Seungju Han, Sungjoo Suh, Eunho Yang

Samsung Advanced Institute of Technology · Samsung · SAIT · Seoul National University · Samsung advanced institute of technology · Korea Advanced Institute of Science & Technology

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摘要

Test-time adaptation updates pretrained models on the fly to handle distribution shifts in test data. While existing research has focused on stable optimization during adaptation, less attention has been given to enhancing model representations for adaptation capability. To address this gap, we propose Test-Time Ensemble (TTE) grounded in the intriguing property of linear mode connectivity. TTE leverages ensemble strategies during adaptation: 1) adaptively averaging the parameter weights of assorted test-time adapted models and 2) incorporating dropout to further promote representation diversity. These strategies encapsulate model diversity into a single model, avoiding computational burden associated with managing multiple models. Besides, we propose a robust knowledge distillation scheme to prevent model collapse, ensuring stable optimization and preserving the ensemble benefits during adaptation. Notably, TTE integrates seamlessly with existing TTA approaches, advancing their adaptation capabilities. In extensive experiments, integration with TTE consistently outperformed baseline models across various challenging scenarios, demonstrating its effectiveness and general applicability.